Items - Atomic force Microscope (AFM),Nano indenter,Micro hardness tester,X-Ray Diffraction (XRD),Optical Profiler,Confocal Microscope,Raman Microscope,Spectroscopic Ellipsometer,Fourier - transform Infrared spectroscopy( FTIR),Energy dispersive spectrometry (EDX) & electron backscattered diffraction (EBSD),Co-Ordinate measuring Machine (CMM),Form Tester,Stereo Microscopy,Sample Preparation,Surface roughness tester (contact type)
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